Sigrity X Advanced SI technology offers leading-edge signal integrity analysis for PCB and IC packaging designs, covering DC to over 56GHz with advanced features like automated die-to-die SI analysis, topology exploration, and simulation for high-speed interfaces. Supporting IBIS-AMI models and customizable compliance kits, it ensures your designs meet rigorous standards while leveraging frequency domain, time domain, and statistical analysis methods.
l Accurate handling of non-ideal power delivery system influences on SI
l Concurrently evaluate SI effects such as losses, reflections, crosstalk, and simultaneous switching output (SSO)
l Support for industry-standard IBIS-AMI transmitter and receiver models enables simulations of channel behavior for serial links with chips from multiple suppliers
l Highly automated measurement and reporting capabilities